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Towards performing high-resolution inelastic X-ray scattering measurements at hard X-ray free-electron lasers coupled with energetic laser drivers.
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- Additional Information
- Source:
Publisher: Wiley Online Library Country of Publication: United States NLM ID: 9888878 Publication Model: Print-Electronic Cited Medium: Internet ISSN: 1600-5775 (Electronic) Linking ISSN: 09090495 NLM ISO Abbreviation: J Synchrotron Radiat Subsets: PubMed not MEDLINE; MEDLINE
- Publication Information:
Publication: [Malden, MA] : Wiley Online Library
Original Publication: Copenhagen : Wiley-Blackwell Munksgaard, c1994-
- Abstract:
High-resolution inelastic X-ray scattering is an established technique in the synchrotron community, used to investigate collective low-frequency responses of materials. When fielded at hard X-ray free-electron lasers (XFELs) and combined with high-intensity laser drivers, it becomes a promising technique for investigating matter at high temperatures and high pressures. This technique gives access to important thermodynamic properties of matter at extreme conditions, such as temperature, material sound speed, and viscosity. The successful realization of this method requires the acquisition of many identical laser-pump/X-ray-probe shots, allowing the collection of a sufficient number of photons necessary to perform quantitative analyses. Here, a 2.5-fold improvement in the energy resolution of the instrument relative to previous works at the Matter in Extreme Conditions (MEC) endstation, Linac Coherent Light Source (LCLS), and the High Energy Density (HED) instrument, European XFEL, is presented. Some aspects of the experimental design that are essential for improving the number of photons detected in each X-ray shot, making such measurements feasible, are discussed. A careful choice of the energy resolution, the X-ray beam mode provided by the XFEL, and the position of the analysers used in such experiments can provide a more than ten-fold improvement in the photometrics. The discussion is supported by experimental data on 10 µm-thick iron and 50 nm-thick gold samples collected at the MEC endstation at the LCLS, and by complementary ray-tracing simulations coupled with thermal diffuse scattering calculations.
(open access.)
- References:
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- Grant Information:
100182 US Department of Energy, Office of Science; 100705 United Kingdom WT_ Wellcome Trust
- Contributed Indexing:
Keywords: XFEL; extreme conditions; high-resolution inelastic X-ray scattering; thermal diffuse scattering
- Publication Date:
Date Created: 20220705 Latest Revision: 20240831
- Publication Date:
20250114
- Accession Number:
PMC9255572
- Accession Number:
10.1107/S1600577522004453
- Accession Number:
35787558
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