Item request has been placed! ×
Item request cannot be made. ×
loading  Processing Request

High resolution electron backscatter diffraction with a field emission gun scanning electron microscope.

Item request has been placed! ×
Item request cannot be made. ×
loading   Processing Request
Read Online Read More Add to Saved list
  • Author(s): Humphreys; Brough
  • Source:
    Journal of Microscopy. Jul99, Vol. 195 Issue 1, p6-9. 04p.