Self-organized mapping of R&D activities: bibliometric cartography of integrated circuit design testing

An exploratory bibliometric analysis of an R&D field (integrated circuit design testing) had the aim of visualizing the field's knowledge structure, and changes over time. It used bibliometric cartography based on co-word analysis. The basic approach and its relation with self-organizing systems are outlined; this includes the techniques for defining the field, drawing on publications (there being few patents for inclusion). The resultant four maps show the cognitive structures of the more scientific and the more technological sides, for 1984–1985 and 1990–1991. The main structure of the field changed relatively little over time, but emerging features of possible future importance can be seen. The maps' modular structure shows the core concepts are very closely related to other specific technologies (gate-arrays, logic devices, and so on), and other specific areas are also important (such as simulation and verification techniques). More specific studies, aiming at particular developments in the method, are suggested, and reader feedback is strongly invited.