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High contrast reflection modulation near 1.55 mu m in InP 2D photonic crystals on silicon wafer

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Author(s): VECCHI, G; RAINERI, F; SAGNES, I; LEE, KH; GUILET, S; LE GRATIET, L; TALNEAU, A; LEVENSON, A; RAJ, R; Van Laere, Frederik; Roelkens, Günther; Van Thourhout, Dries; Baets, Roel
Source:
OPTICS EXPRESS ; ISSN: 1094-4087
Subject Terms:
Technology and Engineering
Document Type:
article in journal/newspaper
Language:
English

Additional Information
- Publication Information:
  OPTICAL SOC AMER
- Publication Date:
  2007
- Collection:
  Ghent University Academic Bibliography
- File Description:
  application/pdf
- Relation:
  https://biblio.ugent.be/publication/388381; http://hdl.handle.net/1854/LU-388381; http://dx.doi.org/1854/9291; https://biblio.ugent.be/publication/388381/file/584419
- Online Access:
  https://biblio.ugent.be/publication/388381
  http://hdl.handle.net/1854/LU-388381
  https://biblio.ugent.be/publication/388381/file/584419
- Rights:
  No license (in copyright) ; info:eu-repo/semantics/openAccess
- Accession Number:
  edsbas.A2837921

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