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Analysis of Numerical Artifacts Using Tetrahedral Meshes in Low Frequency Numerical Dosimetry

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  • Additional Information
    • Contributors:
      Politecnico di Torino = Polytechnic of Turin (Polito); Ampère, Département Bioingénierie (BioIng); Ampère (AMPERE); École Centrale de Lyon (ECL); Université de Lyon-Université de Lyon-Université Claude Bernard Lyon 1 (UCBL); Université de Lyon-Institut National des Sciences Appliquées de Lyon (INSA Lyon); Université de Lyon-Institut National des Sciences Appliquées (INSA)-Institut National des Sciences Appliquées (INSA)-Centre National de la Recherche Scientifique (CNRS)-Institut National de Recherche pour l’Agriculture, l’Alimentation et l’Environnement (INRAE)-École Centrale de Lyon (ECL); Université de Lyon-Institut National des Sciences Appliquées (INSA)-Institut National des Sciences Appliquées (INSA)-Centre National de la Recherche Scientifique (CNRS)-Institut National de Recherche pour l’Agriculture, l’Alimentation et l’Environnement (INRAE)
    • Publication Information:
      CCSD
      Multidisciplinary digital publishing institute (MDPI)
    • Publication Date:
      2022
    • Collection:
      HAL Lyon 1 (University Claude Bernard Lyon 1)
    • Abstract:
      International audience ; Anatomical realistic voxel models of human beings are commonly used in numerical dosimetry to evaluate the human exposure to low-frequency electromagnetic fields. The downside of these models is that they do not correctly reproduce the boundaries of curved surfaces. The stair-casing approximation errors introduce computational artifacts in the evaluation of the induced electric field and the use of post-processing filtering methods is essential to mitigate these errors. With a suitable exposure scenario, this paper shows that tetrahedral meshes make it possible to remove stair-casing errors. However, using tetrahedral meshes is not a sufficient condition to completely remove artifacts, because the quality of the tetrahedral mesh plays an important role. The analyses carried out show that in real exposure scenarios, other sources of artifacts cause peak values of the induced electric field even with regular meshes. In these cases, the adoption of filtering techniques cannot be avoided.
    • Accession Number:
      10.3390/app12136526
    • Online Access:
      https://hal.science/hal-03763262
      https://hal.science/hal-03763262v1/document
      https://hal.science/hal-03763262v1/file/GUBERNATI_FRESCHI_GIACCONE_et_al_2022.pdf
      https://doi.org/10.3390/app12136526
    • Rights:
      http://creativecommons.org/licenses/by/ ; info:eu-repo/semantics/OpenAccess
    • Accession Number:
      edsbas.F9E93205