- Document Number:
20120314205
- Appl. No:
13/472145
- Application Filed:
May 15, 2012
- Abstract:
A defect inspection apparatus comprises a table on which a substrate is placed, a first detection unit which is disposed above the table to detect an optical signal from the substrate, a second detection unit which is disposed above the table to detect an electrical signal from the substrate, and a signal processing unit which is connected to the first detection unit and the second detection unit to detect a chemical defect using the optical signal and the electrical signal.
- Inventors:
SOHN, Young-Hoon (Seongnam-si, KR); YANG, Yu-Sin (Seoul, KR); LEE, Sang-Kil (Yongin-si, KR)
- Assignees:
SAMSUNG ELECTRONICS CO., LTD. (Suwon-si, KR)
- Claim:
1. A defect inspection apparatus comprising: a table on which a substrate is placed; a first detection unit which is disposed above the table and which detects an optical signal from the substrate; a second detection unit which is disposed above the table and which detects an electrical signal from the substrate; and a signal processing unit which is connected to the first detection unit and the second detection unit and which detects a chemical defect using the optical signal and the electrical signal.
- Claim:
2. The defect inspection apparatus of claim 1, wherein the first detection unit comprises a light source which irradiates light onto the substrate, and a sensing unit which senses the light reflected from the substrate.
- Claim:
3. The defect inspection apparatus of claim 2, wherein the light source comprises a laser.
- Claim:
4. The defect inspection apparatus of claim 1, wherein the table is electrically connected to a first voltage, and the second detection unit measures a potential difference between the substrate and the second detection unit to generate the electrical signal corresponding to the potential difference.
- Claim:
5. The defect inspection apparatus of claim 4, wherein the second detection unit comprises a contact potential difference sensor.
- Claim:
6. The defect inspection apparatus of claim 1, wherein the first detection unit detects the optical signal from a substantially same region in which the second detection unit detects the electrical signal.
- Claim:
7. The defect inspection apparatus of claim 1, wherein the optical signal and the electrical signal are detected from the substrate during a relative motion between the first and the second detection units and the table.
- Claim:
8. The defect inspection apparatus of claim 7, wherein the table rotates and the first detection unit and the second detection unit move in a diameter direction of the substrate to detect the optical signal and the electrical signal.
- Claim:
9. The defect inspection apparatus of claim 1, wherein the signal processing unit detects a physical defect based on the optical signal , and detects an electrical defect based on the electrical signal , and detects a chemical defect based on an electrical defect which does not correspond to a physical defect.
- Claim:
10. The defect inspection apparatus of claim 1, wherein the substrate is a patterned substrate and the signal processing unit removes a pattern signal from the optical signal and the electrical signal.
- Claim:
11. A defect inspection apparatus comprising: a table on which a substrate is placed; a first detection unit and a second detection unit which are disposed above the table and which detect an optical signal from an inspection region of the substrate and an electrical signal from the inspection region of the substrate, respectively; and a signal processing unit which is connected to the first detection unit and the second detection unit and which process the optical signal and the electrical signal.
- Claim:
12. The defect inspection apparatus of claim 11, wherein the first detection unit comprises a light source which irradiates light onto the substrate, and a sensing unit which senses the light reflected from the substrate.
- Claim:
13. The defect inspection apparatus of claim 11, wherein the table is electrically connected to a first voltage, and the second detection unit measures a potential difference between the substrate and the second detection unit to generate the electrical signal.
- Claim:
14. The defect inspection apparatus of claim 11, wherein the signal processing unit detects a chemical defect using the optical signal and the electrical signal.
- Claim:
15. The defect inspection apparatus of claim 11, wherein the substrate is a patterned substrate and the signal processing unit removes a pattern signal from the optical signal and the electrical signal.
- Claim:
16. The defect inspection apparatus of claim 11 wherein the first detection unit and the second detection unit detect the optical signal and the electrical signal simultaneously.
- Claim:
17. The defect inspection apparatus of claim 11 wherein the first detection unit detects the optical signal from an inspection region of the substrate at a first time and the second detection unit detects the electrical signal of the region of the substrate at a second time that is different from the first time.
- Claim:
18. An apparatus of detecting a chemical defect in a substrate comprising: a substrate; an optical sensor which generates an optical signal based on light reflected from a region of the substrate; an electrical sensor which generates an electrical signal by measuring the voltage difference between the region of the substrate and a fixed voltage; and a signal processor which detects a chemical defect based on a comparison of the optical signal and the electrical signal.
- Claim:
19. The apparatus of claim 18, wherein the substrate translates relative to the optical sensor and the electrical sensor.
- Claim:
20. The apparatus of claim 18, wherein the substrate rotates and the optical sensor and the electrical sensor translate relative to the substrate.
- Current U.S. Class:
356/72
- Current International Class:
01; 01
- Accession Number:
edspap.20120314205
Processing Request
No Comments.