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Collection : Queen's University Belfast

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Academic Journal

Whole wafer magnetostriction metrology for magnetic films and multilayers

Authors : Hill, C B; Hendren, W R; Bowman, R M

Subjects: /dk/atira/pure/subjectarea/asjc/2600/2604; name=Applied Mathematics; /dk/atira/pure/subjectarea/asjc/3100/3105

Source: Hill, C B, Hendren, W R, Bowman, R M, McGeehan, P K, Gubbins, M A & Venugopal, V A 2013, 'Whole wafer magnetostriction metrology for magnetic films and multilayers',

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