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Collection : Universite De Montpellier Format : Conference Materials Format : Reports Geographic : cartagena Filter by : Subject

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Conference

March Tests Improvements for Address Decoder Open and Resistive Open Fault Detection

Authors : Dilillo, Luigi; Girard, Patrick; Pravossoudovitch, Serge ...

Subjects: [SPI.NANO]Engineering Sciences [physics]/Micro and nanotechnologies/MicroelectronicsCartagena; Colombia

Source: 5th IEEE Latin American Test WorkshopLATW: Latin American Test Workshophttps://hal-lirmm.ccsd.cnrs.fr/lirmm-00108642LATW: Latin American Test Workshop, Mar 2004,

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