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Global yield engineering for IC production.

• Authors : Sack, E.A.

Subjects: *INTEGRATED circuit design; *ENGINEERING; *SEMICONDUCTOR wafers

• Source: Solid State Technology. Dec98, Vol. 41 Issue 12, p81. 5p. 3 Diagrams, 1 Graph.

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Regio- and Stereoselective Oxidation of Styrene Derivatives to Arylalkanoic Acids via One-Pot Cascade Biotransformations.

• Authors : Wu, Shuke^1,2; Zhou, Yi²; Seet, Daniel¹

Subjects: *REGIOSELECTIVITY (Chemistry); *OXIDATION; *STEREOSELECTIVE reactions

• Source: Advanced Synthesis & Catalysis. Jun2017, Vol. 359 Issue 12, p2132-2141. 10p.

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New literature.

Subjects: *SEMICONDUCTOR production equipment

• Source: Solid State Technology. Mar95, Vol. 38 Issue 3, p126. 2p. 3 Color Photographs.

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TAKE A CLOSER LOOK AT ELECTRICALLY-ENHANCED LADA: SETUP.

• Authors : Goh, S. H.^1,2 ; Yeoh, B. L.^1,2; You, G. F.^1,2

Subjects: *FAILURE analysis; *INTEGRATED circuits; *GRAPHICAL user interfaces

• Source: Electronic Device Failure Analysis. Aug2016, Vol. 18 Issue 3, p10-16. 7p.

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Yield-Oriented Logic Failure Characterization for FA Prioritization.

• Authors : Szu Huat Goh¹ ; Boon Lian Yeoh¹; Guo Feng You¹

Subjects: *FAILURE analysis; *SEMICONDUCTOR failures; *SYSTEM failures

• Source: Electronic Device Failure Analysis. Aug2014, Vol. 16 Issue 3, p4-12. 6p.

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