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Authors :
Lin, Jung-Fu [Univ. of Texas, Austin, TX (United States)]
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Source:
Geophysical Research Letters; 43; 16
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Authors :
Pickrell, Gary [Virginia Polytechnic Inst. and State Univ. (Virginia Tech), Blacksburg, VA (United States)]
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Source:
Optical Engineering; 54; 10
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Authors :
Pickrell, Gary [Virginia Polytechnic Inst. and State Univ. (Virginia Tech), Blacksburg, VA (United States)]
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Source:
Optical Engineering; 55; 6
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Authors :
Luo, S. [The Peac Institute of Multiscale Sciences, Sichuan (People's Republic of China); Southwest Jiaotong Univ., Sichuan (People's Republic of China)]
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Source:
Acta Materialia; 114; C
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Authors :
Melot, Brent [Univ. of Southern California, Los Angeles, CA (United States)]
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Source:
Journal of Solid State Chemistry; 236; C
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Authors :
Hemley, Russell [Carnegie Institution of Washington, Washington, D.C. (United States)]
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Source:
Journal of Vacuum Science and Technology. A, Vacuum, Surfaces and Films; 33; 6
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Authors :
Wang, Hsing [Los Alamos National Lab. (LANL), Los Alamos, NM (United States)]
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Source:
ACS Applied Materials and Interfaces; 8; 23
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Authors :
Duffy, Thomas [Princeton Univ., NJ (United States)]
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Source:
American Mineralogist; 100; 8-9
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Authors :
Bauer, Stephen [Sandia National Lab. (SNL-NM), Albuquerque, NM (United States)]
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Source:
International Journal of Rock Mechanics and Mining Sciences; 78; C
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Authors :
Hoffmann, Christina [Oak Ridge National Lab. (ORNL), Oak Ridge, TN (United States)]
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Source:
Journal of Applied Crystallography (Online); 49; 2
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