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Artifacts in digital coincidence timing

• Authors : Peng, Q. [Lawrence Berkeley National Lab. (LBNL), Berkeley, CA (United States)]

• Source: Physics in Medicine and Biology; 59; 21

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Sampling Artifacts from Conductive Silicone Tubing

• Authors : Wilson, Kevin

• Source: Aerosol Science&Technology

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MCMC-based Deconvolution with Reduced Boundary Artifacts and Non-negativity Constraints

• Authors : Morzfeld, Matthias

• Source: Conference: Australian Mathematical Sciences Institute, MATRIX: Computational Inverse Problems Workshop, Melbourne, Australia, June 13-16, 2017

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Mitigation of Selected Hanford Site Manhattan Project and Cold War Era Artifacts

• Authors : Harvey, David

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Pulling History from the Waste Stream: Identification and Collection of Manhattan Project and Cold War Era Artifacts on the Hanford Site

• Authors : Watson, Thomas [Mission Support Alliance, Richland, WA (United States)]

• Source: Conference: WM2014 Waste Management Symposia, Phoenix, AZ (United States), 2-6 Mar 2014; Other Information: Number 14085

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Understanding Artifacts in Impedance Spectroscopy

• Authors : Eastman, J. [Argonne National Lab. (ANL), Argonne, IL (United States). Materials Science Division]

• Source: Journal of the Electrochemical Society; 162; 1

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Detecting and Removing Data Artifacts in Hadamard Transform Ion Mobility-Mass Spectrometry Measurements

• Authors : Payne, Samuel [Pacific Northwest National Lab. (PNNL), Richland, WA (United States). Biological Sciences Division]

• Source: Journal of the American Society for Mass Spectrometry; 25; 12

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Efficient and Accurate Correction of Beam Hardening Artifacts

• Authors : Bremer, T

• Source: Conference: Presented at: The Third International Conference on Image Formation in X-Ray Computed Tomography, Salt Lake City, UT, United States, Jun 22 - Jun 25, 2014

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SUBSURFACE MOBILE PLUTONIUM SPECIATION: SAMPLING ARTIFACTS FOR GROUNDWATER COLLOIDS

• Authors : Buesseler, K

• Source: Conference: Plutonium Futures

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Minimizing Artifacts in Analysis of Surface Statistics

• Authors : Z, Takacs

• Source: Conference: Optical Fabrication & Testing (OF&T); Monterey, CA; 20120624 through 20120628

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