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Academic Journal

Sensitivity analysis: distributional assumptions and confounding assumptions.

  • Authors : Vanderweele TJ; Department of Health Studies, University of Chicago, 5841 South Maryland Avenue, MC 2007, Chicago, Illinois 60637, USA.

Subjects: Artifacts* ; Data Interpretation, Statistical* ; Models, Statistical*

  • Source: Biometrics [Biometrics] 2008 Jun; Vol. 64 (2), pp. 645-9.Publisher: Oxford University Press Country of Publication: England NLM ID: 0370625 Publication Model: Print Cited Medium:

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