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Observation of the transformation of silica phytoliths into SiC and SiO2 particles in biomass-derived carbons by using SEM/EDS, Raman spectroscopy, and XRD

• Authors : Enrique R. Yapuchura; Rodolfo S. Tartaglia; Alfredo G. Cunha

Subjects: 02 engineering and technology; 0210 nano-technology; 01 natural sciences

• Source: Journal of Materials Science. 54:3761-3777

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C.B. Carter and D.B. Williams (eds.): Transmission electron microscopy, diffraction, imaging, and spectroscopy: Springer, Switzerland, 2016, ISBN: 978-3-319-26649-7 (cloth), 978-3-319-26651-0 (eBook), Price: €103.99, US$119, £74.50 (cloth), €83.29, US$89, £58.99 (eBook)

• Authors : Peter Hawkes

Subjects: 02 engineering and technology; 0210 nano-technology; 01 natural sciences

• Source: Journal of Materials Science. 52:2989-2994

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Performing elemental microanalysis with high accuracy and high precision by scanning electron microscopy/silicon drift detector energy-dispersive X-ray spectrometry (SEM/SDD-EDS)

• Authors : Nicholas W. M. Ritchie; Dale E. Newbury

Subjects: Materials Science(all); Mechanics of Materials; 13. Climate action

• Source: J Mater Sci

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Analysis of the microstructure evolution, enhanced hardness and electrical conductivity of T6 heat-treated A319/graphene composites.

• Authors : Andilab, Bernoulli¹ (AUTHOR); Amirkhiz, Babak Shalchi² (AUTHOR); Ravindran, Comondore¹ (AUTHOR)

• Source: Journal of Materials Science. Jan2025, Vol. 60 Issue 3, p1136-1155. 20p.

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Microstructure and corrosion properties of the as-cast Ti–Ni–Cu–Zr alloy.

• Authors : Ostapenko, M. G.¹ (AUTHOR) ; Semin, V. O.¹ (AUTHOR); D'yachenko, F. A.¹ (AUTHOR)

• Source: Journal of Materials Science. Jan2025, Vol. 60 Issue 1, p463-481. 19p.

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Observation of the transformation of silica phytoliths into SiC and SiO2 particles in biomass-derived carbons by using SEM/EDS, Raman spectroscopy, and XRD.

• Authors : Yapuchura, Enrique R.; Tartaglia, Rodolfo S.; Cunha, Alfredo G.

Subjects: SILICA; BIOMASS; PHYTOLITHS

• Source: Journal of Materials Science; Mar2019, Vol. 54 Issue 5, p3761-3777, 17p, 6 Color Photographs, 3 Black and White Photographs, 3 Graphs

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Testing the accuracy of low-beam-energy electron-excited X-ray microanalysis with energy-dispersive spectrometry.

• Authors : Newbury, Dale E.¹ (AUTHOR) ; Ritchie, Nicholas W. M.¹ (AUTHOR)

• Source: Journal of Materials Science. Oct2024, Vol. 59 Issue 40, p19088-19111. 24p.

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Performing elemental microanalysis with high accuracy and high precision by scanning electron microscopy/silicon drift detector energy-dispersive X-ray spectrometry (SEM/SDD-EDS).

• Authors : Newbury, Dale; Ritchie, Nicholas

Subjects: MICROCHEMISTRY; SCANNING electron microscopy; SILICON

• Source: Journal of Materials Science; Jan2015, Vol. 50 Issue 2, p493-518, 26p

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C.B. Carter and D.B. Williams (eds.): Transmission electron microscopy, diffraction, imaging, and spectroscopy.

• Authors : Hawkes, Peter

Subjects: TRANSMISSION electron microscopy; NONFICTIONTRANSMISSION Electron Microscopy: A Textbook for Materials Science (Book)WILLIAMS, David B.; CARTER, C Barry

• Source: Journal of Materials Science; Mar2017, Vol. 52 Issue 6, p2989-2994, 6p, 1 Black and White Photograph, 1 Graph

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Study on the mechanics performance and deformation characteristics of polypropylene fiber-reinforced solid waste-based fill material.

• Authors : Zhang, Xiangdong^1,2 (AUTHOR); Yang, Ji^1,2 (AUTHOR) ; Bing, Yucheng^1,2 (AUTHOR)

• Source: Journal of Materials Science. Feb2025, Vol. 60 Issue 6, p3178-3199. 22p.

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