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Academic Journal

Combined CL/EBIC/DLTS investigation of a regular dislocation network formed by Si wafer direct bonding.

  • Source: Semiconductors. Apr2007, Vol. 41 Issue 4, p458-461. 4p. 2 Diagrams, 5 Graphs.

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Academic Journal

Photoluminescence study on defects in multicrystalline silicon.

  • Source: Semiconductors. Apr2007, Vol. 41 Issue 4, p436-439. 4p. 2 Black and White Photographs, 5 Graphs.

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  • 1-3 of  3 results for ""Kittler, M.""