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Publisher : wiley-vch gmbh

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Academic Journal

A Deep Study of Resistance Switching Phenomena in TaOₓ ReRAM Cells: System-Theoretic Dynamic Route Map Analysis and Experimental Verification

Authors : Ascoli, Alon; Menzel, Stephan; Rana, Vikas

Subjects: dynamische Routenkarten; Fading-Speicher; memristive Bauelemente

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