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Imaging error compensation method for through-focus scanning optical microscopy images based on deep learning.

• Authors : Qu Y; Key Laboratory of Precision Opto-Mechatronics, Technology of Education Ministry, School of Instrumentation and Opto-Electronic Engineering, Beihang University, Beijing, China.; Ren J

Subjects: Deep Learning* ; Microscopy*; Optical Phenomena

• Source: Journal of microscopy [J Microsc] 2021 Aug; Vol. 283 (2), pp. 93-101. Date of Electronic Publication: 2021 Apr 14.Publisher: Published for the Royal Microscopical Society by Blackwell Scientific Publications Country of Publication: England NLM ID: 0204522 Publication Model:

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Multiple parametric nanoscale measurements with high sensitivity based on through‐focus scanning optical microscopy.

• Authors : PENG, R.¹ (AUTHOR); QU, Y.¹ (AUTHOR); HAO, J.¹ (AUTHOR)

• Source: Journal of Microscopy. Jun2019, Vol. 274 Issue 3, p139-149. 11p. 4 Diagrams, 2 Charts, 5 Graphs.

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Interference illumination of three nonzero‐order beams for LCOS‐based structured illumination microscopy.

• Authors : QU, Y.; PAN, H.; PENG, R.

Subjects: OPTICAL diffraction; SPATIAL light modulators; MICROSCOPY

• Source: Journal of Microscopy; Aug2019, Vol. 275 Issue 2, p97-106, 10p, 6 Color Photographs, 1 Diagram, 3 Charts, 4 Graphs

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Characterisation of residual stress distribution in clinching joints of carbon steel by diffraction methods.

• Authors : Peng, R. Lin; Rode, N.; Odén, M.

• Source: Materials Science & Technology. Mar2003, Vol. 19 Issue 3, p336-342. 7p.

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