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Flash‐induced defects in single‐crystal 8YSZ characterized by TEM, XRD, and Raman spectroscopy.

  • Source: Journal of the American Ceramic Society. Sep2024, Vol. 107 Issue 9, p5786-5800. 15p.

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Determining the Tensile Properties and Dispersion Characterization of CNTs in Epoxy Using Tem and Raman Spectroscopy.

  • Source: Mechanics of Composite Materials. May2020, Vol. 56 Issue 2, p215-226. 12p.

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  • 1-10 of  2,419 results for ""Raman spectroscopy""