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Academic Journal

Error estimation of recording I-V-characteristics of Josephson junctions

Subjects: info:eu-repo/classification/ddc/530DE

  • Source: Technical Physics 47, 1408 (2002).

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Conference

Graphene-on-Silicon Hybrid Field-Effect Transistors

Subjects: DE

  • Source: International Conference Graphene and 2 DM and Expo, Graphene 2020, Grenoble, France, 2020-10-19 - 2020-10-23

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Academic Journal

Half-Metal–Spin-Gapless-Semiconductor Junctions as a Route to the Ideal Diode

Subjects: info:eu-repo/classification/ddc/530DE

  • Source: Physical review applied 14(1), 014082 (2020). doi:10.1103/PhysRevApplied.14.014082

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Academic Journal

High intrinsic noise and absence of hysteresis in superconducting quantum interference devices with large Steward-McCumber parameter

Subjects: info:eu-repo/classification/ddc/530DE

  • Source: Applied physics letters 103(4), 042601 (2013). doi:10.1063/1.4816730

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Academic Journal

Electron Transport Properties of Graphene/WS2 Van Der Waals Heterojunctions

Subjects: info:eu-repo/classification/ddc/540DE

  • Source: Molecules 28(19), 6866 - (2023). doi:10.3390/molecules28196866

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Academic Journal

Current-driven magnetoresistance in van der Waals spin-filter antiferromagnetic tunnel junctions with Mn Bi 2 Te 4

Subjects: info:eu-repo/classification/ddc/530DE

  • Source: Physical review applied 20(4), 044056 (2023). doi:10.1103/PhysRevApplied.20.044056

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Academic Journal

Impact of the contacting scheme on I-V measurements of metallization-free silicon heterojunction solar cells

Subjects: info:eu-repo/classification/ddc/670DE

  • Source: EPJ Photovoltaics 14, 18 (2023). doi:10.1051/epjpv/2023009

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Academic Journal

TiN-NbN-TiN and Permalloy Nanostructures for Applications in Transmission Electron Microscopy

Subjects: info:eu-repo/classification/ddc/530DE

  • Source: Electronics 12(9), 2144 - (2023). doi:10.3390/electronics12092144

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Academic Journal

Separation of hot-electron and self-heating effects in two-dimensional AlGaN/GaN-based conductivity channels

Subjects: info:eu-repo/classification/ddc/530DE

  • Source: Applied physics letters 82, 748 - 750 (2003). doi:10.1063/1.1542928

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Academic Journal

TiN nanobridge Josephson junctions and nanoSQUIDs on SiN-buffered Si

Subjects: info:eu-repo/classification/ddc/530DE

  • Source: Superconductor science and technology 35(6), 065001 - (2022). doi:10.1088/1361-6668/ac64cd

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  • 1-10 of  33 results for ""I V characteristics""