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Dissertation/ Thesis

Espectrometría de masas de iones secundarios: aportaciones a la técnica y caracterización de capas finas de a-C:H y de a-Si:H

Subjects: Silici; Semiconductors; Pel-lícules fines

  • Source: TDX (Tesis Doctorals en Xarxa)

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  • 1-10 of  58 results for ""López-Fernández, Francisco""